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DIN EN 61709
Electric components - Reliability - Reference conditions for failure rates and stress models for conversion (IEC 61709:2011); German version EN 61709:2011
Edition
2012-01
DIN EN IEC 60747-15
Semiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices (IEC 47E/812/CDV:2023); German and English version prEN IEC 60747-15:2023
Edition
2024-06
DIN EN IEC 60749-18
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (IEC 60749-18:2019); German version EN IEC 60749-18:2019
Edition
2020-02
DIN 56930-1
Entertainment technology - Stage Lighting Systems - Part 1: Dimmer - Definitions, requirements and user information
Edition
2017-09
DIN EN IEC 60749-34-1
Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module (IEC 47/2759/CD:2022); Text in German and English
Edition
2024-08
DIN EN IEC 60747-16-6
Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers (IEC 60747-16-6:2019); German version EN IEC 60747-16-6:2019
Edition
2021-08
DIN EN 16603-10-12
Space engineering - Method for the calculation of radiation received and its effects, and a policy for design margins; English version EN 16603-10-12:2014
Edition
2014-09
DIN EN 60617-5
Graphical symbols for diagrams - Part 5: Semiconductors and electron tubes (IEC 60617-5:1996); German version EN 60617-5:1996
Edition
1997-08
DIN EN ISO/IEC 80079-38
Explosive atmospheres - Part 38: Equipment and components in explosive atmospheres in underground mines (ISO/IEC 80079-38:2016); German version EN ISO/IEC 80079-38:2016
Edition
2017-10
DIN EN 60747-16-3
Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters (IEC 60747-16-3:2002 + A1:2009 + A2:2017); German version EN 60747-16-3:2002 + A1:2009 + A2:2017
Edition
2018-04