Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module (IEC 47/2759/CD:2022); Text in German and English
Edition 2024-08

Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010); German version EN 62416:2010
Edition 2010-12

Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices (IEC 60747-15:2010); German version EN 60747-15:2012
Edition 2012-08

Semiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices (IEC 47E/812/CDV:2023); German and English version prEN IEC 60747-15:2023
Edition 2024-06

Bicycles - Lighting equipment and dynamos
Edition 2014-12

Space product assurance - Radiation hardness assurance - EEE components; English version EN 16602-60-15:2014
Edition 2014-12

Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 1: General
Edition 2016-08

Space product assurance - Dependability; English version EN 16602-30:2018
Edition 2018-07

Space engineering - Electrical design and interface requirements for power supply; English version EN 16603-20-20:2018
Edition 2019-04

Optical atomic spectral analysis - Principles and definitions
Edition 2013-11