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NF C80-203 ; NF EN 62417:2010-11-01
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
Edition
2010-11-01
BS IEC 62951-9
Semiconductor devices. Flexible and stretchable semiconductor devices. Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells
Edition
2022-12-20
EIA JESD 306
Measurement of Small Signal HF, VHF, and UHF Power Gain of Transistors
Edition
1965-05
OEVE/OENORM EN 62416
Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010) (german version)
Edition
2011-01-01
UNE-EN 62373
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) (IEC 62373:2006). (Endorsed by AENOR in November of 2006.)
Edition
2006-11-01
18/30381548 DC
BS EN 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET). Part 1. Fast BTI Test method
Edition
2018-08-03
NF C80-202 ; NF EN 62416:2010-11-01
Semiconductor devices - Hot carrier test on MOS transistors
Edition
2010-11-01
BS EN 62373
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Edition
2006-09-29
BS IEC 62951-3
Semiconductor devices. Flexible and stretchable semiconductor devices. Evaluation of thin film transistor characteristics on flexible substrates under bulging
Edition
2018-11-15
NF C96-051 ; NF EN 62373:2006-10-01
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Edition
2006-10-01