Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
Edition 2010-11-01

Semiconductor devices. Flexible and stretchable semiconductor devices. Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells
Edition 2022-12-20

Measurement of Small Signal HF, VHF, and UHF Power Gain of Transistors
Edition 1965-05

Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010) (german version)
Edition 2011-01-01

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) (IEC 62373:2006). (Endorsed by AENOR in November of 2006.)
Edition 2006-11-01

BS EN 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET). Part 1. Fast BTI Test method
Edition 2018-08-03

Semiconductor devices - Hot carrier test on MOS transistors
Edition 2010-11-01

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Edition 2006-09-29

Semiconductor devices. Flexible and stretchable semiconductor devices. Evaluation of thin film transistor characteristics on flexible substrates under bulging
Edition 2018-11-15

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Edition 2006-10-01