Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices. Test method for defects using optical inspection
Edition 2019-02-08

Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices. Test method for defects using photoluminescence
Edition 2020-07-24

Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices. Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence
Edition 2022-09-07

Fibre optic interconnecting devices and passive components. Summarising results of round robin on connector end face scratch recognition and verification by automated microscopes
Edition 2021-12-13

Information technology. A study of the differential impact of demographic factors in biometric recognition system performance
Edition 2021-07-20

Traveller processes for biometric recognition in automated border
Edition 2015-03-31

Information technology. Biometric recognition of subjects in motion in access-related systems
Edition 2023-06-12

Environmental statements and programmes for products - Mutual recognition of environmental product declarations (EPDs) and footprint communication programmes
Edition 2022-07-21

RECOGNITION OF SOAP IN REFINED OIL
Edition 1959-02-15

FATS. RECOGNITION OF PEANUT OIL.
Edition 1961-06-15