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BS IEC 63068-2
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices. Test method for defects using optical inspection
Edition
2019-02-08
BS IEC 63068-3
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices. Test method for defects using photoluminescence
Edition
2020-07-24
BS IEC 63068-4
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices. Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence
Edition
2022-09-07
PD IEC/TR 63367
Fibre optic interconnecting devices and passive components. Summarising results of round robin on connector end face scratch recognition and verification by automated microscopes
Edition
2021-12-13
PD ISO/IEC TR 22116
Information technology. A study of the differential impact of demographic factors in biometric recognition system performance
Edition
2021-07-20
PD ISO/IEC TR 29195
Traveller processes for biometric recognition in automated border
Edition
2015-03-31
PD ISO/IEC TS 22604
Information technology. Biometric recognition of subjects in motion in access-related systems
Edition
2023-06-12
PD ISO/TS 14029
Environmental statements and programmes for products - Mutual recognition of environmental product declarations (EPDs) and footprint communication programmes
Edition
2022-07-21
UNE 55029
RECOGNITION OF SOAP IN REFINED OIL
Edition
1959-02-15
UNE 55045
FATS. RECOGNITION OF PEANUT OIL.
Edition
1961-06-15