Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices (IEC 60749-41:2020); German version EN IEC 60749-41:2020
Edition 2023-03

Programmes for reliability growth (IEC 56/1519/CD:2013)
Edition 2014-03

Programmes for reliability growth (IEC 61014:2003); German version EN 61014:2003
Edition 2004-02

Reliability block diagrams (IEC 61078:2016); German version EN 61078:2016
Edition 2018-03

Coatings for loaded printed wire boards (conformal coatings) - Part 3-1: Specifications for individual materials - Coatings for general purpose (Class 1), high reliability (Class 2) and aerospace (Class 3) (IEC 61086-3-1:2004); German version EN 61086-3-1:2004
Edition 2004-12

Reliability testing - Compliance test plans for success ratio (IEC 56/1831/CDV:2019); German and English version prEN IEC 61123:2019
Edition 2020-02

Reliability stress screening - Part 1: Repairable assemblies manufactured in lots (IEC 61163-1:2006); German version EN 61163-1:2006
Edition 2007-06

Reliability stress screening - Part 2: Components (IEC 56/1623/CD:2015)
Edition 2015-12

Reliability growth - Statistical test and estimation methods (IEC 61164:2004); German version EN 61164:2004
Edition 2004-11

Optical amplifiers - Part 5-2: Qualification specifications - Reliability qualification for optical fibre amplifiers (IEC 61291-5-2:2017); German version EN 61291-5-2:2017
Edition 2017-11