Soft solder alloys - Tin and tin alloys - Analysis by spark optical emission spectrometry (S-OES)
Edition 2018-08

Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 2: Determination of particles by optical particle counters
Edition 2009-10

Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 3: Calibration of optical particle counters
Edition 1995-10

Testing of materials for semiconductor technology - Determination of etch rates of etching mixtures - Part 2: Silicon-dioxide coating, optical method
Edition 2023-08

Testing of materials for semiconductor technology - Methods for characterizing photoresists - Part 1: Determination of coating thickness with optical methods
Edition 2009-10

Optical emission spectrometry (OES) - Part 1: Terms for systems with sparks and low pressure discharges
Edition 2004-05

Optical Emission Spectrometry (OES) - Part 2: Terms for flame and plasma systems
Edition 2001-12

Optical atomic spectral analysis - Principles and definitions
Edition 2013-11

Testing of oxidic raw materials and materials for ceramics, glass and glazes - Part 2: Determination of Ag, As, B, Ba, Be, Bi, Ca, Cd, Ce, Co, Cr, Cu, Er, Eu, Fe, La, Mg, Mn, Mo, Nd, Ni, P, Pb, Pr, S, Sb, Se, Sn, Sr, Ti, V, W, Y, Yb, Zn, Zr by optical emission spectrometry with inductively coupled plasma (ICP OES)
Edition 2004-07