Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 60749-5:2023); German version EN IEC 60749-5:2024
Edition 2024-09

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 47/2770/CDV:2022); German and English version prEN IEC 60749-5:2022
Edition 2024-04

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 60749-5:2017); German version EN 60749-5:2017
Edition 2018-01

Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat (IEC 60749-20:2020); German version EN IEC 60749-20:2020
Edition 2023-07

Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST (IEC 60749-24:2004); German version EN 60749-24:2004
Edition 2004-09

Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave (IEC 60749-33:2004); German version EN 60749-33:2004
Edition 2004-09

Reliability stress screening - Part 1: Repairable assemblies manufactured in lots (IEC 61163-1:2006); German version EN 61163-1:2006
Edition 2007-06

Reliability stress screening - Part 2: Components (IEC 56/1623/CD:2015)
Edition 2015-12

Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-24: Tests - Screen testing of ceramic alignment split sleeve by stress application (IEC 61300-2-24:2010); German version EN 61300-2-24:2010
Edition 2011-02

Electrical insulating materials and systems - General method of evaluation of electrical endurance under repetitive voltage impulses (IEC 62068:2013); German version EN 62068:2013
Edition 2014-03