Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006 + A1:2012); German version EN 60749-27:2006 + A1:2012
Edition 2013-04

Industrial communication networks - High availability automation networks - Part 2: Media Redundancy Protocol (MRP) (IEC 62439-2:2021 + COR1:2023); English version EN IEC 62439-2:2022 + AC:2023
Edition 2023-12

Cleanliness of medical devices - Risk orientated validation of cleanliness, development of acceptance criteria and selection of test methods; Text in German and English
Edition 2022-04

Space engineering - Space environment; English version EN 16603-10-04:2021
Edition 2022-08

Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010); German version EN 62416:2010
Edition 2010-12

Fibre optic interconnecting devices and passive components - Performance standard - Part 081-06: Non-connectorized single-mode fibre optic middle-scale 1 x N DWDM devices for category OP+ - Extended outdoor protected environment (IEC 86B/4398/CD:2020); Text in German and English
Edition 2022-10

Transmission and Multiplexing (TM) - Optical Distribution Network (ODN) for Optical Access Network (OAN); English version ETS 300681:1997
Edition 1998-05

Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits (IEC 60747-16-10:2004); German version EN 60747-16-10:2004
Edition 2005-03

Space engineering - Spacecraft charging; English version EN 16603-20-06:2020
Edition 2020-11

Biocompatibility evaluation of breathing gas pathways in healthcare applications - Part 4: Tests for leachables in condensate (ISO/DIS 18562-4:2022); German and English version prEN ISO 18562-4:2022
Edition 2022-12