Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave (IEC 60749-33:2004); German version EN 60749-33:2004
Edition 2004-09

Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST (IEC 60749-24:2004); German version EN 60749-24:2004
Edition 2004-09

Road vehicles; pressure test connection for compressed-air pneumatic braking equipment; identical with ISO 3583, edition 1984
Edition 1987-05

Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state (IEC 60749-36:2003); German version EN 60749-36:2003
Edition 2003-12

Semiconductor devices - Mechanical and climatic test methods - Part 1: General (IEC 60749-1:2002 + Corr. 1:2003); German version EN 60749-1:2003
Edition 2003-12

Maritime navigation and radiocommunication equipment and systems - General requirements - Methods of testing and required test results (IEC 60945:2002); German version EN 60945:2002
Edition 2003-07

Bituminous mixtures - Test methods for hot mix asphalt - Part 38: Common equipment and calibration; German version EN 12697-38:2004
Edition 2004-10

Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyser method (IEC 61290-5-2:2003); German version EN 61290-5-2:2004
Edition 2004-12

Sensory analysis - Descriptive analysis with following quality evaluation
Edition 2018-04

Gymnastic equipment - Vaulting boxes - Construction, execution, safety requirements and test methods; Consolidated version with DIN EN 916
Edition 2003-07