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NF X21-067 ; NF ISO 17974:2009-05-01
Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
Edition
2009-05-01
ISO/TR 18394
Surface chemical analysis - Auger electron spectroscopy - Derivation of chemical information
Edition
2016-05
ISO 17974
Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
Edition
2002-10
ASTM E 983
Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy
Edition
2019
ASTM E 984
Standard Guide for Identifying Chemical Effects and Matrix Effects in Auger Electron Spectroscopy
Edition
2012
ASTM E 996
Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
Edition
2019
DIN ISO 18115-1
Surface chemical analysis - Vocabulary - Part 1: General terms and terms used in spectroscopy (ISO 18115-1:2013)
Edition
2017-07
DIN ISO 15472
Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
Edition
2020-05
DIN ISO 18516
Surface chemical analysis - Determination of lateral resolution and sharpness in beam based methods with a range from nanometers to micrometers (ISO 18516:2019); Text in English
Edition
2020-11
DIN 28400-6
Vacuum technology; terms and definitions, surface analysis techniques
Edition
1980-10
