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DIN 77009-1
Personal and household services - Part 1: Information, advice and placement
Edition
2024-09
DIN EN 60512-16-4
Connectors for electronic equipment - Tests and measurements - Part 16-4: Mechanical tests on contacts and terminations - Test 16d: Tensile strength (crimped connections) (IEC 60512-16-4:2008); German version EN 60512-16-4:2008
Edition
2009-03
DIN EN 61300-2-34
Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-34: Tests - Resistance to solvents and contaminating fluids of interconnecting components and closures (IEC 61300-2-34:2009); German version EN 61300-2-34:2009
Edition
2009-12
DIN EN 61300-2-15
Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-15: Tests - Torque strength of coupling mechanism (IEC 61300-2-15:2008); German version EN 61300-2-15:2008
Edition
2008-09
DIN EN 60297-3-102
Mechanical structures for electronic equipment - Dimensions of mechanical structures of the 482,6 mm (19 in) series - Part 3-102: Injector/extractor handle (IEC 60297-3-102:2004); German version EN 60297-3-102:2004
Edition
2005-06
DIN EN 60317-30
Specifications for particular types of winding wires - Part 30: Polyimide enamelled rectangular copper wire, class 220 (IEC 60317-30:1990 + A1:1997 + A2:2005); German version EN 60317-30:1996 + A1:1998 + A2:2005
Edition
2006-09
DIN EN 60512-14-5
Connectors for electronic equipment - Tests and measurements - Part 14-5: Sealing tests - Test 14e: Immersion at low air pressure (IEC 60512-14-5:2006); German version EN 60512-14-5:2006
Edition
2006-11
DIN EN 60774-2
Helical-scan video tape cassette system using 12,65 mm (0,5 in) magnetic tape on type VHS - Part 2: FM audio recording (IEC 60774-2:1999); German version EN 60774-2:2000
Edition
2000-10
DIN EN 60317-4
Specifications for particular types of winding wires - Part 4: Solderable polyurethane enamelled round copper wire, class 130 (IEC 60317-4:1990 + A1:1997 + A2:1999); German version EN 60317-4:1994 + A1:1998 + A2:2000
Edition
2000-10
DIN EN 60749-1
Semiconductor devices - Mechanical and climatic test methods - Part 1: General (IEC 60749-1:2002 + Corr. 1:2003); German version EN 60749-1:2003
Edition
2003-12