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NF C93-620-5-1 ; NF EN 60679-5-1:2000-04-01
Quartz crystal controlled oscillators of assessed quality - Part 5-1 : Blank detail specification qualification approval
Edition
2000-04-01
NF C93-620-5 ; NF EN 60679-5:1999-12-01
Quartz crystal controlled oscillators of assessed quality - Part 5: sectional specification - Qualification approval
Edition
1999-12-01
NF C96-016-5 ; NF EN 60747-16-5:2014-02-22
Semiconductor devices - Part 16-5 : microwave integrated circuits - Oscillators
Edition
2014-02-22
NF C93-684-3 ; NF EN IEC 62884-3:2018-05-18
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: frequency aging test methods
Edition
2018-05-18
NF C93-620-3 ; NF EN 60679-3:2013-11-02
Quartz crystal controlled oscillators of assessed quality - Part 3: standard outlines and lead connections
Edition
2013-11-02
NF C96-016-5/A1 ; NF EN 60747-16-5/A1:2020-09-18
Semiconductor devices - Part 16-5 : microwave integrated circuits - Oscillators
Edition
2020-09-18
SN EN IEC 62884-3
Measurement techniques of piezoelectric, dieletric and electrostatic oscillators - Part 3: Frequency aging test methods
Edition
2018-05
SN EN 62884-1
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
Edition
2017-09
SN EN 60679-1
Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
Edition
2017-11
SN EN 62884-2
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method
Edition
2017-12
