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Standards [CURRENT]

DIN EN 14997

Characterization of waste - Leaching behaviour test - Influence of pH on leaching with continuous pH control; German version EN 14997:2015
Edition 2015-05

Standards [CURRENT]

DIN EN ISO 9241-391

Ergonomics of human-system interaction - Part 391: Requirements, analysis and compliance test methods for the reduction of photosensitive seizures (ISO 9241-391:2016); German version EN ISO 9241-391:2016
Edition 2016-10

Standards [CURRENT]

DIN ISO 9276-6

Representation of results of particle size analysis - Part 6: Descriptive and quantitative representation of particle shape and morphology (ISO 9276-6:2008)
Edition 2012-01

Standards [CURRENT]

DIN EN 12385-10

Steel wire ropes - Safety - Part 10: Spiral ropes for general structural applications; German version EN 12385-10:2003+A1:2008
Edition 2008-07

Standards [CURRENT]

DIN EN ISO 787-24

General methods of test for pigments and extenders - Part 24: Determination of relative tinting strength of coloured pigments and relative scattering power of white pigments; photometric methods (ISO 787-24:1985); German version EN ISO 787-24:1995
Edition 1995-10

Standards [CURRENT]

DIN EN ISO 6507-4

Metallic materials - Vickers hardness test - Part 4: Tables of hardness values (ISO 6507-4:2018); German version EN ISO 6507-4:2018
Edition 2018-07

Standards [CURRENT]

DIN EN 60749-44

Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (IEC 60749-44:2016); German version EN 60749-44:2016
Edition 2017-04

Standards [CURRENT]

DIN EN 62047-26

Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures (IEC 62047-26:2016); German version EN 62047-26:2016
Edition 2016-12

Standards [CURRENT]

DIN EN 62047-19

Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses (IEC 62047-19:2013); German version EN 62047-19:2013
Edition 2014-04

Standards [CURRENT]

DIN EN 62047-17

Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films (IEC 62047-17:2015); German version EN 62047-17:2015
Edition 2015-12

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