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Standards [CURRENT]

DIN EN 60512-11-10

Connectors for electronic equipment - Tests and measurements - Part 11-10: Climatic tests; Test 11j: Cold (IEC 60512-11-10:2002); German version EN 60512-11-10:2002
Edition 2003-01

Standards [CURRENT]

DIN EN 60512-11-11

Connectors for electronic equipment - Tests and measurements - Part 11-11: Climatic tests; Test 11k: Low air pressure (IEC 60512-11-11:2002); German version EN 60512-11-11:2002
Edition 2003-01

Standards [CURRENT]

DIN EN 60512-11-12

Connectors for electronic equipment - Tests and measurements - Part 11-12: Climatic tests; Test 11m: Damp heat, cyclic (IEC 60512-11-12:2002); German version EN 60512-11-12:2002
Edition 2003-01

Standards [CURRENT]

DIN EN 60512-11-13

Connectors for electronic equipment - Tests and measurements - Part 11-13: Climatic tests; Test 11n: Gas tightness, solderless wrapped connections (IEC 60512-11-13:2002); German version EN 60512-11-13:2002
Edition 2003-01

Standards [CURRENT]

DIN EN 60749-2

Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure (IEC 60749-2:2002); German version EN 60749-2:2002
Edition 2003-04

Standards [CURRENT]

DIN EN 62148-4

Fibre optic active components and devices - Package and interface standards - Part 4: PN 1x9 plastic optical fibre transceivers (IEC 62148-4:2003); German version EN 62148-4:2003
Edition 2004-02

Standards [CURRENT]

DIN EN 60512-11-7

Connectors for electronic equipment - Tests and measurements - Part 11-7: Climatic tests - Test 11g: Flowing mixed gas corrosion test (IEC 60512-11-7:2003); German version EN 60512-11-7:2003
Edition 2004-06

Standards [CURRENT]

DIN EN 60512-11-14

Connectors for electronic equipment - Tests and measurements - Part 11-14: Climatic tests - Test 11p: Flowing single gas corrosion test (IEC 60512-11-14:2003); German version EN 60512-11-14:2003
Edition 2004-06

Standards [CURRENT]

DIN EN 60749-16

Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND) (IEC 60749-16:2003); German version EN 60749-16:2003
Edition 2003-09

Standards [CURRENT]

DIN EN 60749-36

Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state (IEC 60749-36:2003); German version EN 60749-36:2003
Edition 2003-12

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