Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers (IEC 62374-1:2010); German version EN 62374-1:2010 + AC:2011
Edition 2011-06

Excavations, foundations and underpinnings in the area of existing buildings
Edition 2013-04

Classification methods for evaluation of random vibrations
Edition 1969-10

Dust emission of technical equipment - Basic method for determination of the dust emission rate of machines intended for the use on work tables
Edition 2016-07

Classification of environmental conditions - Part 3: Classification of groups of environmental parameters and their severities; section 9: Microclimates inside products (IEC 60721-3-9:1993); German version EN 60721-3-9:1993
Edition 1995-01

X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
Edition 2015-03

Design of strengthened soil - Set up by means of jet grouting, deep mixing or grouting
Edition 2015-11

High-pressure sodium vapour lamps - Performance specifications (IEC 60662:2011, modified); German version EN 60662:2012 + A11:2019
Edition 2019-12

Characterization of solids - Quality assurance and quality control - Re-transferability of measurement results of the test characteristics with regard to their distinctness and distribution in the population
Edition 2021-12

Air cleaner and air humidifier - Part 100: Electrical air-conditioner for household and similar use; Methods for measuring the performance
Edition 2002-01