Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling (IEC 60749-25:2003); German version EN 60749-25:2003
Edition 2004-04

Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST (IEC 60749-24:2004); German version EN 60749-24:2004
Edition 2004-09

Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS (IEC 62047-9:2011); German version EN 62047-9:2011
Edition 2012-03

Glass - Viscosity and viscometric fixed points - Part 1: Principles for determining viscosity and viscometric fixed points (ISO 7884-1:1987)
Edition 1998-02

Fixed resistors for use in electronic equipment - Part 1: Generic specification (IEC 40/2662/CDV:2019); Text in German and English
Edition 2020-05

German standard methods for the examination of water, waste water and sludge - Parameters characterizing effects and substances (group H) - Part 60: Spectrometric determination of the chlorophyll-a concentration in water (H 60)
Edition 2019-12

Maritime navigation and radiocommunication equipment and systems - Data Interface - Part 1: S-421 Route Plan Based on S-100 (IEC 80/948/CD:2019); Text in German and English
Edition 2020-08

Communication networks and systems for power utility automation - Part 6-2: Configuration description language for extensions for human machine interfaces (IEC 57/2466/CD:2022); Text in German and English
Edition 2022-10

Road vehicles - Vehicle to grid communication interface - Part 4: Network and application protocol conformance test (ISO/DIS 15118-4:2021); English version prEN ISO 15118-4:2021, only on CD-ROM
Edition 2021-10

Universal Serial Bus interfaces for data and power - Part 2-1: Universal Serial Bus Specification, Revision 2.0 (IEC 100/2331/CDV:2014); English version FprEN 62680-2-1:2014
Edition 2015-05