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DIN EN 15269-2
Extended application of test results for fire resistance and/or smoke control for door, shutter and openable window assemblies, including their elements of building hardware - Part 2: Fire resistance of hinged and pivoted steel doorsets; German and English version prEN 15269-2:2022
Edition
2022-12
DIN EN 15269-4
Extended application of test results for fire resistance and/or smoke control for door, shutter and openable window assemblies, including their elements of building hardware - Part 4: Fire resistance of hinged and pivoted glass doorsets; German and English version prEN 15269-4:2022
Edition
2022-10
DIN EN 13124-1
Windows, doors, shutters and curtain walling - Explosion resistance - Test method - Part 1: Shock tube; German and English version prEN 13124-1:2022
Edition
2022-02
DIN EN 17549-1
Building Information Modelling (BIM) - Information structure based on EN ISO 16739-1:2018 to exchange data templates and data sheets for construction objects - Part 1: Data templates and configured construction objects; English version prEN 17549-1:2022, only on CD-ROM
Edition
2022-07
DIN EN IEC 61158-5-10
Industrial communication networks - Fieldbus specifications - Part 5-10: Application layer service definition - Type 10 elements (IEC 61158-5-10:2019); English version EN IEC 61158-5-10:2019, only on CD-ROM
Edition
2020-07
DIN EN IEC 61158-6-10
Industrial communication networks - Fieldbus specifications - Part 6-10: Application layer protocol specification - Type 10 elements (IEC 61158-6-10:2019); English version EN IEC 61158-6-10:2019, only on CD-ROM
Edition
2020-08
DIN EN 13124-2
Windows, doors, shutters and curtain walling - Explosion resistance - Test method - Part 2: Arena test; German and English version prEN 13124-2:2023
Edition
2023-09
DIN EN 1995-3
Eurocode 5: Design of timber structures - Part 3: Execution; German and English version prEN 1995-3:2023
Edition
2023-09
UNE-EN 62374-1
Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers (Endorsed by AENOR in March of 2011.)
Edition
2011-03-01
BS EN 62374-1
Semiconductor devices. Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
Edition
2010-12-31