Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory (IEC 60749-38:2008); German version EN 60749-38:2008
Edition 2008-10

Teleweb application - Part 1: General description (IEC 62298-1:2005); German version EN 62298-1:2005
Edition 2005-11

Classification of environmental conditions - Part 1: Environmental parameters and their severities (IEC 60721-1:1990 + A1:1992 + A2:1995); German version EN 60721-1:1995 + A2:1995
Edition 1997-02

Agricultural equipment - Graphical symbols for pressurized irrigation systems (ISO 15081:2011)
Edition 2015-02

Data element catalogue for bibliographic data; data element catalogue for the description of institutions
Edition 1988-09

Road vehicles - Automation of the wiring-harness production
Edition 2024-06

Semiconductor devices - Part 16-9: Microwave integrated circuits - Phase shifters (IEC 47E/768/CD:2021); Text in German and English
Edition 2022-06

Outdoor enclosure for non-weather protected locations in telecommunication, signalling, traffic control systems and low-voltage power supply - Requirements and tests
Edition 2023-11

Plastics piping systems - Unplasticized poly(vinyl chloride) (PVC-U) end-load-bearing double-socket joints - Test method for leaktightness and strength while subjected to bending and internal pressure (ISO 13783:1997); German version EN ISO 13783:1997
Edition 1998-07

Communication network dependability engineering (IEC 61907:2009); German version EN 61907:2010
Edition 2010-09