Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 6: Determination of 36 elements in a high-purity ammonium fluoride solution (NH₄F) and in etching mixtures of high-purity ammonium fluoride solution containing hydrofluoric acid
Edition 2014-11

Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 7: Determination of 31 elements in high-purity hydrochloric acid by ICP-MS
Edition 2018-04

Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 3: Determination of 31 elements in high-purity nitric acid by ICP-MS
Edition 2014-11

Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 4: Determination of 34 elements in ultra pure water by mass spectrometry with inductively coupled plasma (ICP-MS)
Edition 2007-02

Colorimetry - Part 9: Reflectance standard for calibration in colorimetry and photometry
Edition 2024-07

Energy performance of buildings - Heating systems and DHW in buildings - Part 1: Inspection of boilers, heating systems and DHW, Module M3-11, M8-11; German version EN 15378-1:2017
Edition 2017-09

Energy performance of buildings - Economic evaluation procedure for energy systems in buildings - Part 1: Calculation procedures, Module M1-14; German version EN 15459-1:2017
Edition 2017-09

Energy performance of buildings - Thermal, solar and daylight properties of building components and elements - Part 3: Detailed calculation method of the solar and daylight characteristics for solar protection devices combined with glazing (ISO 52022-3:2017); German version EN ISO 52022-3:2017
Edition 2018-01

Expression of performance of electrochemical analyzers - Part 4: Dissolved oxygen in water measured by membrane-covered amperometric sensors (IEC 60746-4:2018); German version EN IEC 60746-4:2019
Edition 2019-10

Testing of ceramic raw materials and ceramic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry with electrothermal vaporisation (ETV-ICP-OES); German and English version prEN 15991:2024
Edition 2024-07