Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module (IEC 47/2759/CD:2022); Text in German and English
Edition 2024-08

Terminal markings for valve device stacks and assemblies and for power conversion equipment (IEC 61148:2011); German version EN 61148:2012
Edition 2012-04

Electrical insulating materials and systems - Electrical measurement of partial discharges (PD) under short rise time and repetitive voltage impulses (IEC/TS 61934:2011)
Edition 2012-09

Graphical symbols for diagrams - Part 5: Semiconductors and electron tubes (IEC 60617-5:1996); German version EN 60617-5:1996
Edition 1997-08

Semiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices (IEC 47E/812/CDV:2023); German and English version prEN IEC 60747-15:2023
Edition 2024-06

Electric components - Reliability - Reference conditions for failure rates and stress models for conversion (IEC 56/1583/CD:2014)
Edition 2015-01

Electric components - Reliability - Reference conditions for failure rates and stress models for conversion (IEC 61709:2011); German version EN 61709:2011
Edition 2012-01

Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010); German version EN 62417:2010
Edition 2010-12

Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (IEC 60749-18:2019); German version EN IEC 60749-18:2019
Edition 2020-02

Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications (IEC 61338-2:2004); German version EN 61338-2:2004
Edition 2005-02