Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (IEC 60749-44:2016); German version EN 60749-44:2016
Edition 2017-04

Dynamic modules - Part 2-1: Reliability qualification - Test template (IEC 62343-2-1:2019); German version EN IEC 62343-2-1:2019
Edition 2020-08

Reliability of fibre optic interconnecting devices and passive components - Part 1: Introductory guide and definitions (IEC 62005-1:2001); German version EN 62005-1:2001
Edition 2002-02

Root cause analysis (RCA) (IEC 62740:2015); German version EN 62740:2015
Edition 2015-11

Explosives for civil uses - Detonators and detonating cord relays - Part 27: Risk analysis and test methods for electronic initiation systems; German and English version prEN 13763-27:2021
Edition 2021-11

Dependability management - Part 3-12: Application guide - Integrated logistic support (IEC 60300-3-12:2011); German version EN 60300-3-12:2011
Edition 2011-08

Industrial thermoprocessing equipment - Part 8: Particular safety requirements for quenching equipment; German version EN 746-8:2000
Edition 2001-04

Dependability management - Part 3-15: Application guide - Engineering of system dependability (IEC 60300-3-15:2009); German version EN 60300-3-15:2009
Edition 2010-05

Fundamentals of maintenance
Edition 2019-06

Equipment reliability - Reliability assessment methods (IEC 62308:2006); German version EN 62308:2006
Edition 2007-07