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BS IEC 62860
Test methods for the characterization of organic transistors and materials
Edition
2014-08-31
IEEE 62860
IEC/IEEE Test methods for the characterization of organic transistors and materials
Edition
2013
SN EN 62417
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
Edition
2010-05
BS EN 120003
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Phototransistors, photodarlington transistors, phototransistor arrays
Edition
1986-11-15
BS IEC 62899-503-1
Printed electronics. Quality assessment. Test method of displacement current measurement for printed thin-film transistor
Edition
2020-09-25
BS IEC 60747-7+A1
Semiconductor devices. Discrete devices. Bipolar transistors
Edition
2011-02-28
SN EN 62416
Semiconductor devices - Hot carrier test on MOS transistors
Edition
2010-06
UNE-EN 62417
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (Endorsed by AENOR in September of 2010.)
Edition
2010-09-01
EIA JESD 302
Ranges and Conditions for Specifying Beta for Low Power, Audio Frequency Transistors for Entertainment Service
Edition
1965-01
SN EN 62373
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Edition
2006-08