Test methods for the characterization of organic transistors and materials
Edition 2014-08-31

IEC/IEEE Test methods for the characterization of organic transistors and materials
Edition 2013

Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
Edition 2010-05

Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Phototransistors, photodarlington transistors, phototransistor arrays
Edition 1986-11-15

Printed electronics. Quality assessment. Test method of displacement current measurement for printed thin-film transistor
Edition 2020-09-25

Semiconductor devices. Discrete devices. Bipolar transistors
Edition 2011-02-28

Semiconductor devices - Hot carrier test on MOS transistors
Edition 2010-06

Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (Endorsed by AENOR in September of 2010.)
Edition 2010-09-01

Ranges and Conditions for Specifying Beta for Low Power, Audio Frequency Transistors for Entertainment Service
Edition 1965-01

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Edition 2006-08