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BS EN 62374-1
Semiconductor devices. Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
Edition
2010-12-31
SN EN 62374-1
Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
Edition
2010-11
SN EN 62374-1+CORR
Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
Edition
2011-04
NF C96-017 ; NF EN 62374:2008-01-01
Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films
Edition
2008-01-01
ISO/TR 20659-2
Rheological test methods - Fundamentals and interlaboratory comparisons - Part 2: Determination of the time-dependent structural change (thixotropy)
Edition
2024-03
OEVE/OENORM EN 62374-1
Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers (IEC 62374-1:2010) (german version)
Edition
2011-08-01
OEVE/OENORM EN 62374
Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films (IEC 62374:2007)
Edition
2008-03-01
DIN EN ISO 18229
Essential technical requirements for mechanical components and metallic structures foreseen for Generation IV nuclear reactors (ISO 18229:2018); English version EN ISO 18229:2021
Edition
2021-10
DIN EN ISO 12747
Oil and gas industries including lower carbon energy - Pipeline transportation systems - Recommended practice for pipeline life extension (ISO/DIS 12747:2024); English version prEN ISO 12747:2024
Edition
2024-04
DIN ETS 300710
Integrated Services Digital Network (ISDN) - Public Switched Telephone Network (PSTN) - Universal Access Number (UAN) service - Service description; English version ETS 300710:1997
Edition
1997-12
