Semiconductor devices - Metallization stress void test (IEC 62418:2010); German version EN 62418:2010
Edition 2010-12

Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films (IEC 62374:2007); German version EN 62374:2007
Edition 2008-02

Maritime navigation and radiocommunication equipment and systems - Marine speed and distance measuring equipment (SDME) - Performance requirements, methods of testing and required test results (IEC 61023:2007); German version EN 61023:2007
Edition 2008-05

Equipment for use in audio and video door-entry systems; German version EN 50486:2008
Edition 2008-11

Digital audio broadcast system - Specification of the receiver data interface (RDI) (IEC 62105:1999); German version EN 62105:2002
Edition 2007-03

Straight thermocouple assembly with metal or ceramic protection tube and accessories; German version EN 50446:2006
Edition 2007-04

Graphite electrodes for electric arc furnaces - Dimensions and designation (IEC 60239:2005); German version EN 60239:2005
Edition 2006-03

Photovoltaic systems - Power conditioners - Procedure for measuring efficiency (IEC 61683:1999); German version EN 61683:2000
Edition 2000-08

Integrated circuits - Memory devices pin configurations (IEC 61964:1999); German version EN 61964:1999
Edition 2000-01

Preparation of outline drawings for cathode-ray tubes, their components, connections and gauges (IEC 60139:2000); German version EN 60139:2001
Edition 2001-10