Connectors for electronic equipment - Tests and measurements - Part 6-4: Dynamic stress tests - Test 6d: Vibration (sinusoidal) (IEC 60512-6-4:2002)
Edition 2003-06-01

Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 6: Dynamic stress tests - Section 5: Test 6e: Random vibration (IEC 60512-6-5:1997, modified)
Edition 2001-01-01

Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST (IEC 60749-24:2004)
Edition 2004-11-01

Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave (IEC 60749-33:2004)
Edition 2004-11-01

Reliability stress screening - Part 1: Repairable assemblies manufactured in lots (IEC 61163-1:2006)
Edition 2007-07-01

Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-24: Tests - Screen testing of ceramic alignment split sleeve by stress application (IEC 61300-2-24:2010) (german version)
Edition 2011-03-01

Electrical insulating materials and systems - General method of evaluation of electrical endurance under repetitive voltage impulses (IEC 62068:2013) (german version)
Edition 2014-04-01

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) (IEC 62373:2006)
Edition 2007-03-01

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 47/2770/CDV) (english version)
Edition 2022-10-15