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Modular order for the development of mechanical structures for electronic equipment practices - Part 2-5 : sectional specification - Interface co-ordination dimensions for the 25 mm equipment practice - Cabinet interface dimensions for miscellaneous equipment
Edition 2013-02-02

EMC IC modelling - Part 2: models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
Edition 2017-07-28

Standards [CURRENT]

UNE-EN IEC 61189-2-720

Test methods for electrical materials, circuit boards and other interconnection structures and assemblies - Part 2-720: Detection of defects in interconnection structures by measurement of capacitance (Endorsed by Asociación Española de Normalización in June of 2024.)
Edition 2024-06-01

Hinweise von ISO/TC 176 - Deutsche Übersetzung der englischsprachigen Buches "ISO 9001:2015 for Small Enterprises - What to do?"
Edition 2017-06

Standards [CURRENT]

ISO 17331 AMD 1

Surface chemical analysis - Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy; Amendment 1
Edition 2010-07

Standards [CURRENT]

ISO 17331

Surface chemical analysis - Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
Edition 2004-05

Anforderungen und Umsetzung
Edition 2020-12

Beispiele, Strategien, Lösungen
Edition 2014-06

Technik, Auswahl und Auslegung - Mit Anmerkungen für Heimspeicher
Edition 2018-05

In 10 Schritten zur Konformitätserklärung
Edition 2017-03

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