Connectors for electronic equipment - Tests and measurements - Part 6-3: Dynamic stress tests; Test 6c: Shock (IEC 60512-6-3:2002); German version EN 60512-6-3:2002
Edition 2003-01

Connectors for electronic equipment - Tests and measurements - Part 2-3: Electrical continuity and contact resistance tests; Test 2c: Contact resistance variation (IEC 60512-2-3:2002); German version EN 60512-2-3:2002
Edition 2003-01

Connectors for electronic equipment - Tests and measurements - Part 2-6: Electrical continuity and contact resistance tests; Test 2f: Housing (shell) electrical continuity (IEC 60512-2-6:2002); German version EN 60512-2-6:2002
Edition 2003-01

Connectors for electronic equipment - Tests and measurements - Part 11-3: Climatic tests; Test 11c: Damp heat, steady state (IEC 60512-11-3:2002); German version EN 60512-11-3:2002
Edition 2003-01

Connectors for electronic equipment - Tests and measurements - Part 11-5: Climatic tests; Test 11e: Mould growth (IEC 60512-11-5:2002); German version EN 60512-11-5:2002
Edition 2003-01

Connectors for electronic equipment - Tests and measurements - Part 11-9: Climatic tests; Test 11i: Dry heat (IEC 60512-11-9:2002); German version EN 60512-11-9:2002
Edition 2003-01

Connectors for electronic equipment - Tests and measurements - Part 11-10: Climatic tests; Test 11j: Cold (IEC 60512-11-10:2002); German version EN 60512-11-10:2002
Edition 2003-01

Connectors for electronic equipment - Tests and measurements - Part 11-12: Climatic tests; Test 11m: Damp heat, cyclic (IEC 60512-11-12:2002); German version EN 60512-11-12:2002
Edition 2003-01

Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure (IEC 60749-2:2002); German version EN 60749-2:2002
Edition 2003-04

Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state (IEC 60749-36:2003); German version EN 60749-36:2003
Edition 2003-12