Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination (IEC 60749-3:2017); German version EN 60749-3:2017
Edition 2018-01

Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage (IEC 60749-42:2014); German version EN 60749-42:2014
Edition 2015-05

Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength (IEC 60749-19:2003 + A1:2010); German version EN 60749-19:2003 + A1:2010
Edition 2011-01

Semiconductor die products - Part 6: Requirements for information concerning thermal simulation (IEC 62258-6:2006); German version EN 62258-6:2006
Edition 2007-02

Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile-testing (IEC 62047-3:2006); German version EN 62047-3:2006
Edition 2007-02

Electroacoustics - Hearing aids - Part 8: Methods of measurement of performance characteristics of hearing aids under simulated in situ working conditions (IEC 60118-8:2005); German version EN 60118-8:2005
Edition 2006-08

Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature; Two-fluid-bath method (IEC 60749-11:2002); German version EN 60749-11:2002
Edition 2003-04

Transmission and Multiplexing (TM) - Digitale Radio Relay Systems (DRRS) - Part 1: Antennas for point-to-point (P-P) radio links in the 1 GHz to 3 GHz bands; English version EN 300631-1 V 1.1.1:1997-11
Edition 1998-09

Dentistry - Materials for dental instruments - Part 1: Stainless steel (ISO 21850-1:2020); German version EN ISO 21850-1:2020
Edition 2020-08

Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking (IEC 60749-9:2017); German version EN 60749-9:2017
Edition 2017-11