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Standards [CURRENT]

DIN 32989

Accessible design - Information contents, figuration and display methods of tactile guide maps
Edition 2021-08

Standards [CURRENT]

DIN EN 62258-6

Semiconductor die products - Part 6: Requirements for information concerning thermal simulation (IEC 62258-6:2006); German version EN 62258-6:2006
Edition 2007-02

Standards [CURRENT]

DIN EN IEC 62878-2-602

Device embedding assembly technology - Part 2-602: Guideline for stacked electronic module - Evaluation method of inter-module electrical connectivity (IEC 62878-2-602:2021); German version EN IEC 62878-2-602:2021
Edition 2022-08

Standards [CURRENT]

DIN EN 61300-3-25

Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 3-25: Examinations and measurements - Concentricity of non-angled ferrules and non-angled ferrules with fibre installed (IEC 61300-3-25:2016); German version EN 61300-3-25:2016
Edition 2017-05

Standards [CURRENT]

DIN EN 61300-2-35

Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-35: Tests - Cable nutation (IEC 61300-2-35:2014); German version EN 61300-2-35:2014
Edition 2015-01

Standards [CURRENT]

DIN EN 60749-42

Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage (IEC 60749-42:2014); German version EN 60749-42:2014
Edition 2015-05

Standards [Pre-order]

DIN EN IEC 61189-2-804

Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 2-804: Test methods for time to delamination - T260, T288, T300 (IEC 61189-2-804:2023); German version EN IEC 61189-2-804:2023
Edition 2024-10

Standards [CURRENT]

DIN EN IEC 62828-1

Reference conditions and procedures for testing industrial and process measurement transmitters - Part 1: General procedures for all types of transmitters (IEC 62828-1:2017); German version EN IEC 62828-1:2018
Edition 2018-11

Standards [CURRENT]

DIN EN IEC 61189-5-501

Test methods for electrical materials, printed boards and other interconnection structures and assemblies - Part 5-501: General test methods for materials and assemblies - Surface insulation resistance (SIR) testing of solder fluxes (IEC 61189-5-501:2021); German version EN IEC 61189-5-501:2021
Edition 2022-08

Standards [CURRENT]

DIN EN 60444-8

Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2016); German version EN 60444-8:2017
Edition 2017-11

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