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22/30458390 DC
BS EN 61674 Ed.3.0. Medical electrical equipment. Dosimeters with ionization chambers and/or semiconductor detectors as used in X-ray diagnostic imaging
Edition
2022-07-07
BS ISO 17470
Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
Edition
2014-01-31
BS ISO 14706
Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
Edition
2014-07-31
JIS A 1481-3
Determination of asbestos in building material products - Part 3: Quantitative analysis of containing asbestos by X-ray diffraction method
Edition
2014-04-01
JIS K 2541-4
Crude oil and petroleum products - Determination of sulfur content Part 4: Energy-dispersive X-ray fluorescence method
Edition
2003-07-20
JIS K 2541-7
Crude oil and petroleum products - Determination of sulfur content Part 7: Wavelength-dispersive X-ray fluorescence method
Edition
2003-07-20
JIS K 0148
Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
Edition
2005-03-20
JIS Z 4752-2-10
Evaluation and routine testing in medical imaging departments - Part 2-10: Constancy tests - X-ray equipment for mammography
Edition
2005-03-25
JIS A 1481-3/AMENDMENT 1
Determination of asbestos in building material products - Part 3: Quantitative analysis of containing asbestos by X-ray diffraction method (Amendment 1)
Edition
2022-01-20
UNE-EN 24503
HARDMETALS. DETERMINATION OF CONTENT OF METALLOC ELEMENTS BY X-RAY FLUORENSCENCE. FUSION METHOD (Endorsed by AENOR in May of 1993.)
Edition
1993-05-01