BS EN 61674 Ed.3.0. Medical electrical equipment. Dosimeters with ionization chambers and/or semiconductor detectors as used in X-ray diagnostic imaging
Edition 2022-07-07

Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
Edition 2014-01-31

Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
Edition 2014-07-31

Determination of asbestos in building material products - Part 3: Quantitative analysis of containing asbestos by X-ray diffraction method
Edition 2014-04-01

Crude oil and petroleum products - Determination of sulfur content Part 4: Energy-dispersive X-ray fluorescence method
Edition 2003-07-20

Crude oil and petroleum products - Determination of sulfur content Part 7: Wavelength-dispersive X-ray fluorescence method
Edition 2003-07-20

Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
Edition 2005-03-20

Evaluation and routine testing in medical imaging departments - Part 2-10: Constancy tests - X-ray equipment for mammography
Edition 2005-03-25

Determination of asbestos in building material products - Part 3: Quantitative analysis of containing asbestos by X-ray diffraction method (Amendment 1)
Edition 2022-01-20

HARDMETALS. DETERMINATION OF CONTENT OF METALLOC ELEMENTS BY X-RAY FLUORENSCENCE. FUSION METHOD (Endorsed by AENOR in May of 1993.)
Edition 1993-05-01