Industrial-process measurement and control - Data structures and elements in process equipment catalogues - Part 15: Lists of properties (LOPs) for level measuring equipment for electronic data exchange
Edition 2017-02

Industrial-Process Measurement and Control - Data Structures and Elements in Process Equipment Catalogues - Part 14: Lists of properties (LOP) for temperature measuring equipment for electronic data exchange
Edition 2016-07

Industrial-process measurement and control - Data structures and elements in process equipment catalogues - Part 13: Lists of properties (LOP) for Pressure Measuring Equipment for electronic data exchange
Edition 2016-06

Geometrical product specifications (GPS) - Acceptance and reverification tests for coordinate measuring systems (CMS) - Part 9: CMMs with multiple probing systems (ISO 10360-9:2013)
Edition 2014-03

Fibre optic communication subsystem test procedures - Part 2-12: Digital systems - Measuring eye diagrams and Q-factor using a software triggering technique for transmission signal quality assessment
Edition 2014-07

Measurement of DC magnetic, AC magnetic and AC electric fields from 1 Hz to 100 kHz with regard to exposure of human beings - Part 1: Requirements for measuring instruments
Edition 2014-03

Geometrical product specifications (GPS) - Coordinate measuring machines (CMM): Technique for determining the uncertainty of measurement - Part 3: Use of calibrated workpieces or measurement standards (ISO 15530-3:2011)
Edition 2012-01

Geometrical product specifications (GPS) - Acceptance and reverification tests for coordinate measuring machines (CMM) - Part 7: CMMs equipped with imaging probing systems (ISO 10360-7:2011)
Edition 2011-09

Geometrical product specifications (GPS) - Inspection by measurement of workpieces and measuring equipment - Part 3: Guidelines for achieving agreements on measurement uncertainty statements (ISO 14253-3:2011)
Edition 2011-11

Mechanical standardization of semiconductor devices - Part 6-21: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of small outline packages (SOP)
Edition 2010-10