Semiconductor devices - Metallization stress void test (IEC 62418:2010); German version EN 62418:2010
Edition 2010-12

Electrical networks; algebraification of topology and fundamentals of electrical network calculation
Edition 1988-04

Guide to dynamic measurements of piezoelectric ceramics with high electromechanical coupling; identical with IEC 60483, edition 1976
Edition 1988-04

Navigation - Concepts, abbreviations, letter symbols, graphical symbols
Edition 2005-02

Image quality assurance in diagnostic X-ray departments - Part 14: Constancy testing of X-ray installations for digital mammography
Edition 2022-01

Measurement of liquid flow in closed conduits - Weighing method (ISO 4185:1980 + Cor. 1:1993); German version EN 24185:1993 + AC:1993
Edition 2024-02

Calibration of optical time-domain reflectometers (OTDR) - Part 2: OTDR for multimode fibres (IEC 61746-2:2010); German version EN 61746-2:2011
Edition 2011-09

Clinical dosimetry - Part 1: Radiation quality of photon and electron radiation
Edition 2010-03

Entertainment technology - Practical types - Part 1: Wooden ramps, corner ramps, bevels, corner bevels
Edition 2011-11

Gyromagnetic materials intended for application at microwave frequencies - Measuring methods for properties (IEC 60556:2006 + A1:2016); German version EN 60556:2006 + A1:2016
Edition 2017-02