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DIN 5031-10
Optical radiation physics and illuminating engineering - Part 10: Photobiologically effective radiation, quantities, symbols and action spectra
Edition
2018-03
DIN EN 62734
Industrial networks - Wireless communication network and communication profiles - ISA 100.11a (IEC 62734:2014 + A1:2019); English version EN 62734:2015 + A1:2019
Edition
2020-11
DIN EN IEC 63287-2
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile (IEC 47/2718/CDV:2021); German and English version prEN IEC 63287-2:2021
Edition
2022-06
DIN EN 62680-2-2
Universal Serial Bus interfaces for data and power - Part 2-2: Universal Serial Bus - Micro-USB Cables and Connectors Specification, Revision 1.01 (IEC 100/2332/CDV:2014); English version FprEN 62680-2-2:2014
Edition
2015-05
DIN EN IEC 60749-12
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (IEC 60749-12:2017); German version EN IEC 60749-12:2018
Edition
2018-07
DIN EN 60749-6
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature (IEC 60749-6:2017); German version EN 60749-6:2017
Edition
2017-11
DIN EN 60749-32
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced) (IEC 60749-32:2002 + Cor. :2003 + A1:2010); German version EN 60749-32:2003 + Cor. :2003 + A1:2010
Edition
2011-01
DIN EN 60749-2
Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure (IEC 60749-2:2002); German version EN 60749-2:2002
Edition
2003-04
DIN EN 60749-16
Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND) (IEC 60749-16:2003); German version EN 60749-16:2003
Edition
2003-09
DIN EN 60749-36
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state (IEC 60749-36:2003); German version EN 60749-36:2003
Edition
2003-12