Optical radiation physics and illuminating engineering - Part 10: Photobiologically effective radiation, quantities, symbols and action spectra
Edition 2018-03

Industrial networks - Wireless communication network and communication profiles - ISA 100.11a (IEC 62734:2014 + A1:2019); English version EN 62734:2015 + A1:2019
Edition 2020-11

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile (IEC 47/2718/CDV:2021); German and English version prEN IEC 63287-2:2021
Edition 2022-06

Universal Serial Bus interfaces for data and power - Part 2-2: Universal Serial Bus - Micro-USB Cables and Connectors Specification, Revision 1.01 (IEC 100/2332/CDV:2014); English version FprEN 62680-2-2:2014
Edition 2015-05

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (IEC 60749-12:2017); German version EN IEC 60749-12:2018
Edition 2018-07

Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature (IEC 60749-6:2017); German version EN 60749-6:2017
Edition 2017-11

Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced) (IEC 60749-32:2002 + Cor. :2003 + A1:2010); German version EN 60749-32:2003 + Cor. :2003 + A1:2010
Edition 2011-01

Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure (IEC 60749-2:2002); German version EN 60749-2:2002
Edition 2003-04

Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND) (IEC 60749-16:2003); German version EN 60749-16:2003
Edition 2003-09

Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state (IEC 60749-36:2003); German version EN 60749-36:2003
Edition 2003-12