Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat (IEC 60749-20:2020); German version EN IEC 60749-20:2020
Edition 2023-07

Clinical dosimetry - Part 8: Dosimetry of small photon fields
Edition 2023-08

Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile-testing (IEC 62047-3:2006); German version EN 62047-3:2006
Edition 2007-02

Fixed resistors for use in electronic equipment; blank detail specification: fixed low-power non-wirewound resistors; assessment level E; identical with IEC 60115-2-1, edition 1982
Edition 1987-04

Fixed resistors for use in electronic equipment; blank detail specification: Fixed resistor networks with individually measurable resistors, all of equal value and equal dissipation; assessment level E; identical with IEC 60115-6-1, edition 1983
Edition 1986-09

Fertilizers and liming materials - Vocabulary - Part 1: General terms (including corrigendum AC:2000); German version EN 12944-1:1999 + AC:2000
Edition 2000-03

Liquid crystal display devices - Part 6-2: Measuring methods for liquid crystal display modules - Reflective type (IEC 61747-6-2:2011); German version EN 61747-6-2:2011
Edition 2012-02

Methods of measurement on radio receivers for various classes of emission - Part 4: Receivers for frequency-modulated sound broadcasting emissions (IEC 60315-4:1997); German version EN 60315-4:1998
Edition 1998-12

Calculation of load capacity of bevel gears - Part 2: Calculation of surface durability (macropitting)
Edition 2024-06

Concepts, abbreviations and symbols in geodesy - Part 1: General
Edition 2020-03