Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 60749-29:2011); German version EN 60749-29:2011
Edition 2012-01

Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) (IEC 60444-6:2021); German version EN IEC 60444-6:2021
Edition 2023-11

Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection (IEC 62047-7:2011); German version EN 62047-7:2011
Edition 2012-02

Radiological protection - Minimum criteria for electron paramagnetic resonance (EPR) spectroscopy for retrospective dosimetry of ionizing radiation - Part 2: Ex vivo human tooth enamel dosimetry (ISO 13304-2:2020); German version EN ISO 13304-2:2022
Edition 2023-04

Acoustics - Guidelines for noise control by silencers (ISO 14163:1998); German version EN ISO 14163:1998
Edition 1999-05

Radiological protection - Minimum criteria for electron paramagnetic resonance (EPR) spectroscopy for retrospective dosimetry of ionizing radiation - Part 1: General principles (ISO 13304-1:2020); German version EN ISO 13304-1:2022
Edition 2023-04

Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2016); German version EN 60444-8:2017
Edition 2017-11

Welding - Laser beam process for material treatment - Terms for processes and equipment
Edition 2009-08

Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines (IEC 60862-3:2003); German version EN 60862-3:2003
Edition 2004-08

Semiconductor devices - Semiconductor interface for automotive vehicles - Part 2: Efficiency evaluation methods of wireless power transmission using resonance for automotive vehicles sensors (IEC 62969-2:2018); German version EN IEC 62969-2:2018
Edition 2018-09