Search results

Search list

Results in:

131-140 of 4,284 results
Draft standard [New]

OENORM EN 16303/A1

Road restraint systems - Validation and verification process for the use of virtual testing in crash testing against vehicle restraint system
Edition 2024-08-15

Standards [CURRENT]

OEVE/OENORM EN 61340-3-1

Electrostatics - Part 3-1: Methods for simulation of electrostatic effects - Human body model (HBM) electrostatic discharge test waveforms (IEC 61340-3-1:2006)
Edition 2008-05-01

Standards [CURRENT]

OEVE/OENORM EN 61340-3-2

Electrostatics - Part 3-2: Methods for simulation of electrostatic effects - Machine model (MM) electrostatic discharge test waveforms (IEC 61340-3-2:2006)
Edition 2008-01-01

Standards [CURRENT]

OEVE/OENORM EN 62258-5

Semiconductor die products - Part 5: Requirements for information concerning electrical simulation (IEC 62258-5:2006)
Edition 2007-03-01

Standards [CURRENT]

OEVE/OENORM EN 62258-6

Semiconductor die products - Part 6: Requirements for information concerning thermal simulation (IEC 62258-6:2006)
Edition 2007-03-01

Standards [CURRENT]

OVE EN IEC 60794-1-402

Optical fibre cables - Part 1-402: Generic specification - Basic optical cable test procedures - Electrical test methods - Lightning test (for OPGW, OPPC and OPAC), Method H2 (( IEC 60794-1-402:2021) EN IEC 60794-1-402:2021) (german version)
Edition 2023-01-01

Standards [CURRENT]

OVE EN IEC 61400-27-1

Wind energy generation systems - Part 27-1: Electrical simulation models - Generic models ((IEC 61400-27-1:2020) EN IEC 61400-27-1:2020) (german version)
Edition 2022-09-01

Standards [CURRENT]

OVE EN IEC 61400-27-2

Wind energy generation systems - Part 27-2: Electrical simulation models - Model validation ((IEC 61400-27-2:2020) EN IEC 61400-27-2:2020) (german version)
Edition 2022-09-01

Standards [CURRENT]

OVE EN IEC 62433-6

EMC IC modelling - Part 6: Models of integrated circuits for Pulse immunity behavioural simulation - Conducted Pulse immunity modelling (ICIM-CPI) (( IEC 62433-6:2020) EN IEC 62433-6:2020) (english version)
Edition 2023-11-01

Draft standard

OVE EN IEC 63378-3

Thermal standardization on semiconductor packages - Part 3: Thermal circuit simulation models of discrete semiconductor packages for transient analysis (IEC 47D/967/CDV) (english version)
Edition 2024-06-01

Related searches

Choose a keyword to learn more:
TOP