Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave (IEC 60749-33:2004); German version EN 60749-33:2004
Edition 2004-09

Mechanical standardization of semiconductor devices - Part 6-10: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Dimensions of P-VSON (IEC 60191-6-10:2003); German version EN 60191-6-10:2003
Edition 2004-05

Aerospace series - Steel X5CrNiCu15-5 (1.4545) - Consumable electrode remelted - Solution treated and precipitation treated - Sheets and strips - a ≤ 6 mm - 1070 MPa ≤ Rₘ ≤ 1220 MPa; German version ASD-STAN prEN 3361:2023
Edition 2024-01

Mine plans - Subdivision of sheets
Edition 2017-08

Chain connectors - Part 2: Kenter type connectors
Edition 2015-09

Mine plans - Deep mining - Part 4: Hazardous zones, zones of protective measures
Edition 2009-02

Mine plans - Mineral deposits - Part 2: Thicknesses
Edition 2004-08

Aerospace; concepts, quantities and symbols for flight dynamics; motions of the aircraft and the atmosphere relative to the earth; ISO 1151-2:1985 (status as of 1987) modified
Edition 1990-10

Mine plans - Petrography - Part 3: Metamorphic and other lithogenetic phenomena
Edition 1996-04

Railway applications - Measuring of new railway vehicles - Part 8: Measuring processes for bodies put on running gear
Edition 2012-02