Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling (IEC 60749-25:2003); German version EN 60749-25:2003
Edition 2004-04

Controllers with analogue signals for use in industrial-process control systems - Part 1: Methods of evaluating the performance (IEC 60546-1:2010); German version EN 60546-1:2010
Edition 2011-06

Methods of measurement for minidisc recorders/players (IEC 62121:2001); German version EN 62121:2001
Edition 2002-05

Guide to the measurement of equivalent electrical parameters of quartz crystal units; identical with IEC 61080:1991
Edition 1993-02

Semiconductor devices - Micro-electromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures (IEC 62047-12:2011); German version EN 62047-12:2011
Edition 2012-06

Piezoelectric filters of assessed quality - Part 1: Generic specification (IEC 60368-1:2000 + A1:2004); German version EN 60368-1:2000 + A1:2004
Edition 2005-04

Magnetic tape sound recording and reproducing systems - Part 5: Electrical magnetic tape properties (IEC 60094-5:1988 + A1:1996); German version EN 60094-5:1993 + A1:1996
Edition 1996-12

Loran-C receivers for ships; minimum performance standards; methods of testing and required test results (IEC 61075:1991, modified); German version EN 61075:1993
Edition 1994-03

Common interface specification for conditional access and other digital video broadcasting decoder applications; German version EN 50221:1997 + Corrigendum:2000
Edition 2001-03

Piezoelectric sensors - Part 3: Physical sensors (IEC 63041-3:2020); German version EN IEC 63041-3:2020
Edition 2021-07