Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials (IEC 62047-6:2009); German version EN 62047-6:2010
Edition 2010-07

Digital audio - Interface for non-linear PCM encoded audio bitstreams applying IEC 60958 - Part 11: MPEG-4 AAC and its extensions in LATM/LOAS (IEC 61937-11:2010); German version EN 61937-11:2010
Edition 2010-11

Fibre optic communication subsystem test procedures - Part 2-9: Digital systems - Optical signal-to-noise ratio measurement for dense wavelength-division multiplexed systems (IEC 61280-2-9:2009); German version EN 61280-2-9:2009
Edition 2009-12

Environmental testing - Part 5: Guide to drafting of test methods; terms and definitions (IEC 60068-5-2:1990); German version EN 60068-5-2:1999
Edition 2000-08

Optical amplifiers - test methods - Part 10-3: Multichannel parameters - Probe methods (IEC 61290-10-3:2002); German version EN 61290-10-3:2003
Edition 2004-02

Expression of performance of electrochemical analyzers - Part 2: pH-value (IEC 60746-2:2003 + Corrigendum 2003); German version EN 60746-2:2003
Edition 2003-09

Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing (IEC 60749-8:2002 + Corr. 1:2003 + Corr. 2:2003); German version EN 60749-8:2003
Edition 2003-12

Measurement of the electrical properties of electronic tubes; part 14: methods of measurement of radar and oscilloscope cathode-ray tubes
Edition 1980-05

Industrial-process measurement and control equipment; operating conditions; part 1: climatic conditions (IEC 60654-1:1993); German version EN 60654-1:1993
Edition 1994-02

Environmental testing; part 2: test methods; test Z/ABDM: climatic sequence (IEC 60068-2-61:1991); German version EN 60068-2-61:1993
Edition 1993-12