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OVE EN IEC 60749-41
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices ((IEC 60749-41:2020) EN IEC 60749-41:2020) (german version)
Edition
2023-04-01
BS QC 790105
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Integrated circuit fusible-link programmable bipolar read-only memories
Edition
1992-02-15
BS QC 790106
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Digital integrated circuits. Blank detail specification. MOS ultraviolet light erasable electrically programmable read-only memories
Edition
1995-05-15
EIA JEP 166E
JC-42.6 Manufacturer Identification (ID) Code for Low Power Memories
Edition
2023-07
Edition
2022-09
Kritische Erfolgsfaktoren für Management und Erstellung
Edition
2015-10
Surface texture
Theory and practical use
Edition
2020-06
Industrielle Kommunikation
Basistechnologie für die Digitalisierung der Industrie - Industrie 4.0
Edition
2017-09
Keyboard layouts
Keyboard and input technology for text and office systems
Edition
2014-06
Industrie 4.0 im internationalen Kontext
Kernkonzepte, Ergebnisse, Trends
Edition
2017-04
