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DIN EN 61987-21
Industrial-process measurement and control - Data structures and elements in process equipment catalogues - Part 21: List of Properties (LOP) of automated valves for electronic data exchange - Generic structures (IEC 61987-21:2015); German version EN 61987-21:2016
Edition
2016-07
DIN EN 62575-1
Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification (IEC 62575-1:2015); German version EN 62575-1:2016
Edition
2016-09
DIN EN 60393-5
Potentiometers for use in electronic equipment - Part 5: Sectional specification - Single-turn rotary low-power wirewound and nonwirewound potentiometers (IEC 60393-5:2015); German version EN 60393-5:2016
Edition
2016-12
DIN EN 60393-6
Potentiometers for use in electronic equipment - Part 6: Sectional specification - Surface mount preset potentiometers (IEC 60393-6:2015); German version EN 60393-6:2016
Edition
2016-12
DIN EN 60384-8
Fixed capacitors for use in electronic equipment - Part 8: Sectional specification - Fixed capacitors of ceramic dielectric, Class 1 (IEC 60384-8:2015); German version EN 60384-8:2015
Edition
2015-12
DIN EN 60384-9
Fixed capacitors for use in electronic equipment - Part 9: Sectional specification - Fixed capacitors of ceramic dielectric, Class 2 (IEC 60384-9:2015); German version EN 60384-9:2015
Edition
2015-12
DIN EN 61937-6
Digital audio - Interface for non-linear PCM encoded audio bitstreams applying IEC 60958 - Part 6: Non-linear PCM bitstreams according to the MPEG-2 AAC and MPEG-4 AAC formats (IEC 61937-6:2006 + A1:2014); German version EN 61937-6:2006 + A1:2014
Edition
2015-06
DIN EN 60068-2-83
Environmental testing - Part 2-83: Tests - Test Tf: Solderability testing of electronic components for surface mounting devices (SMD) by the wetting balance method using solder paste (IEC 60068-2-83:2011); German version EN 60068-2-83:2011
Edition
2012-07
DIN EN 61988-2-1
Plasma display panels - Part 2-1: Measuring methods - Optical and optoelectrical (IEC 61988-2-1:2012); German version EN 61988-2-1:2012
Edition
2012-10
DIN EN 60749-29
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 60749-29:2011); German version EN 60749-29:2011
Edition
2012-01