Semiconductor devices - Micro-electromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures (IEC 62047-12:2011); German version EN 62047-12:2011
Edition 2012-06

High frequency inductive components - Part 1: Fixed surface mount inductors for use in electronic and telecommunication equipment (IEC 62674-1:2012); German version EN 62674-1:2012
Edition 2013-06

Multimedia systems and equipment - Colour measurement and management - Part 5: Equipment using plasma display panels (IEC 61966-5:2008); German version EN 61966-5:2009
Edition 2010-02

Organic light emitting diode (OLED) displays - Part 1-1: Generic specifications (IEC 62341-1-1:2009); German version EN 62341-1-1:2009
Edition 2010-05

Plasma display panels - Part 5: Generic specification (IEC 61988-5:2009); German version EN 61988-5:2009
Edition 2010-05

Industrial-process control valves - Part 9: Test procedure for response measurements from step inputs (IEC 60534-9:2007); German version EN 60534-9:2007
Edition 2008-06

Quantities and units - Part 6: Electromagnetism (IEC 80000-6:2008); German version EN 80000-6:2008
Edition 2008-09

Connectors for electronic equipment - Quality assessment requirements - Part 1: Generic specification (IEC 62197-1:2006); German version EN 62197-1:2006
Edition 2007-02

Equipment reliability testing - Part 6: Tests for the validity and estimation of the constant failure rate and constant failure intensity (IEC 60605-6:2007)
Edition 2007-11

Piezoelectric filters of assessed quality - Part 1: Generic specification (IEC 60368-1:2000 + A1:2004); German version EN 60368-1:2000 + A1:2004
Edition 2005-04