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Standards [CURRENT]

DIN EN 61193-2

Quality assessment systems - Part 2: Selection and use of sampling plans for inspection of electronic components and packages (IEC 61193-2:2007); German version EN 61193-2:2007
Edition 2008-08

Standards [CURRENT]

DIN EN 60027-4

Letter symbols to be used in electric technology - Part 4: Rotating electric machines (IEC 60027-4:2006); German version EN 60027-4:2007
Edition 2008-03

Standards [CURRENT]

DIN EN 60027-6

Letter symbols to be used in electrical technology - Part 6: Control technology (IEC 60027-6:2006); German version EN 60027-6:2007
Edition 2008-04

Standards [CURRENT]

DIN EN 61753-092-6

Fibre optic interconnecting devices and passive components performance standard - Part 092-6: Non-connectorized single-mode circulators for category O - Uncontrolled environment and sequential test (IEC 61753-092-6:2007); German version EN 61753-092-6:2007 + Cor.:2008
Edition 2008-04

Standards [CURRENT]

DIN EN 61290-10-2

Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer (IEC 61290-10-2:2007); German version EN 61290-10-2:2008
Edition 2008-07

Standards [CURRENT]

DIN EN 61753-083-2

Fibre optic interconnecting devices and passive components performance standard - Part 083-2: Non-connectorised single-mode fibre optic C-band/L-band WDM devices for category C - Controlled environment (IEC 61753-083-2:2007); German version EN 61753-083-2:2008
Edition 2008-09

Standards [CURRENT]

DIN EN 60749-38

Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory (IEC 60749-38:2008); German version EN 60749-38:2008
Edition 2008-10

Standards [CURRENT]

DIN EN 61966-2-5

Multimedia systems and equipment - Colour measurement and management - Part 2-5: Colour management - Optional RGB colour space - opRGB (IEC 61966-2-5:2007); German version EN 61966-2-5:2008
Edition 2008-09

Standards [CURRENT]

DIN EN 60749-35

Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components (IEC 60749-35:2006); German version EN 60749-35:2006
Edition 2007-03

Standards [CURRENT]

DIN EN 61747-3

Liquid crystal display devices - Part 3: Liquid crystal display (LCD) cells - Sectional specification (IEC 61747-3:2006); German version EN 61747-3:2006
Edition 2007-03

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