Tabular layouts of properties - Part 136: Holder and chuck tools for rotating and stationary grinding and dressing tools
Edition 2011-09

Semiconductor devices - Metallization stress void test (IEC 62418:2010); German version EN 62418:2010
Edition 2010-12

Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films (IEC 62374:2007); German version EN 62374:2007
Edition 2008-02

Optical radiation physics and illuminating engineering; quantities, symbols and units of illuminating engineering
Edition 1982-03

Aerospace; classification of special workshop facilities; process group C; separation
Edition 1989-11

Blank detail specification: Ambient rated photocouplers with phototransistor output; German version EN 120004:1992
Edition 1997-02

Driving Elements; Centre Distances for V-belt Drives
Edition 1973-12

Design guide for railway vehicles and their components - Bolted joints - Part 2: Design - Mechanical applications
Edition 2015-12

Chromium(VI) free passivation of non-ferrous metals - Part 2: Aluminium and aluminium alloys
Edition 2015-12

Sampling procedures for inspection by attributes - Two-stage sampling plans for auditing and for inspection under prior information (ISO 28596:2022); Text in German and English
Edition 2024-09