Semiconductor devices - Mechanical and climatic test methods - Part 1: General (IEC 60749-1:2002 + Corr. 1:2003); German version EN 60749-1:2003
Edition 2003-12

Environmental testing - Part 2: Tests - Test Xb: Abrasion of markings and letterings caused by rubbing of fingers and hands (IEC 60068-2-70:1995); German version EN 60068-2-70:1996
Edition 1996-07

Liquid crystal and solid-state display devices - Part 5: Environmental, endurance and mechanical test methods (IEC 61747-5:1998); German version EN 61747-5:1998
Edition 1999-02

Aerospace series - Elements of electrical and optical connection; test methods - Part 210: Electrical overload; German version EN 2591-210:1998
Edition 1998-08

Aerospace series - Elements of electrical and optical connection; test methods - Part 323: Thermal shock; German version EN 2591-323:1998
Edition 1998-08

Aerospace series - Elements of electrical and optical connection; Test methods - Part 506: Use of tools; German and English version EN 2591-506:2001
Edition 2002-10

Aerospace series - Elements of electrical and optical connection; Test methods - Part 428: Sinusoidal vibrations with passage of current for crimped terminal lugs; German and English version EN 2591-428:2002
Edition 2003-05

Aerospace series - Elements of electrical and optical connection; test methods - Part 305: Rapid change of temperature; German version EN 2591-305:1997
Edition 1997-12

Aerospace series - Elements of electrical and optical connection; test methods - Part 309: Dry heat; German version EN 2591-309:1997
Edition 1997-12

Aerospace series - Elements of electrical and optical connection; test methods - Part 311: Low air pressure; German version EN 2591-311:1997
Edition 1997-12