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Standards [CURRENT]

DIN EN 60512-14-2

Connectors for electronic equipment - Tests and measurements - Part 14-2: Sealing tests - Test 14b: Sealing - Fine air leakage (IEC 60512-14-2:2006); German version EN 60512-14-2:2006
Edition 2006-11

Standards [CURRENT]

DIN EN 60512-1-2

Connectors for electronic equipment - Tests and measurements - Part 1-2: General examination; Test 1b: Examination of dimension and mass (IEC 60512-1-2:2002); German version EN 60512-1-2:2002
Edition 2003-01

Standards [CURRENT]

DIN EN 60749-35

Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components (IEC 60749-35:2006); German version EN 60749-35:2006
Edition 2007-03

Standards [CURRENT]

DIN EN 61290-10-2

Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer (IEC 61290-10-2:2007); German version EN 61290-10-2:2008
Edition 2008-07

Standards [CURRENT]

DIN 50460

Determination of magnetic properties of soft magnetic materials; general, terminology and principles of measurement
Edition 1988-08

Standards [CURRENT]

DIN EN 789

Timber structures - Test methods - Determination of mechanical properties of wood based panels; German version EN 789:2004
Edition 2005-01

Standards [CURRENT]

DIN EN 62739-2

Test method for erosion of wave soldering equipment using molten lead-free solder alloy - Part 2: Erosion test method for metal materials with surface processing (IEC 62739-2:2016); German version EN 62739-2:2016
Edition 2017-04

Standards [CURRENT]

DIN EN 62739-1

Test method for erosion of wave soldering equipment using molten lead-free solder alloy - Part 1: Erosion test method for metal materials without surface processing (IEC 62739-1:2013); German version EN 62739-1:2013
Edition 2014-02

Standards [CURRENT]

DIN EN 2078

Aerospace series - Metallic materials - Manufacturing schedule, inspection schedule, inspection and test report; Definition, general principles, preparation and approval; German and English version EN 2078:2001
Edition 2003-06

Standards [CURRENT]

DIN EN IEC 60749-30

Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2020); German version EN IEC 60749-30:2020
Edition 2023-02

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