Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly (IEC 60749-10:2022); German version EN IEC 60749-10:2022
Edition 2023-12

Sampling equipments on milk collecting tankers - Part 3: Minimum requirements for inspection authorities who carry out verifications or type verifications
Edition 2016-03

End-face image analysis procedure for the calibration of optical fibre geometry test sets (IEC 61745:2017); German version EN 61745:2017
Edition 2018-06

Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory (IEC 60749-38:2008); German version EN 60749-38:2008
Edition 2008-10

Measurement by means of detector tubes - Part 2: Terminology
Edition 2017-09

Aerospace series -Elements of electrical and optical connection; test methods - Part 409: Contact retention in insert; German version EN 2591-409:1999
Edition 1999-06

Rolling bearings - Testing conditions for the experimental verification of the dynamic load rating of ball carriage or roller carriage profiled rail guides
Edition 2024-09

Aerospace series - Elements of electrical and optical connection; test methods - Part 407: Durability of contact retention system and seals; German version EN 2591-407:1999
Edition 1999-06

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (IEC 60749-13:2018); German version EN IEC 60749-13:2018
Edition 2018-10

Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking (IEC 60749-9:2017); German version EN 60749-9:2017
Edition 2017-11