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Semiconductor devices - Mechanical and climatic test methods - Part 27: electrostatic discharge (ESD) sensivity testing - Machine model (MM)
Edition 2006-12-01

Ball screws - Part 1: vocabulary and designation
Edition 2006-12-01

Ball screws - Part 3: acceptance conditions and acceptance tests
Edition 2006-12-01

Extra low-voltage lighting installation
Edition 2006-11-01

Heat shrinkable moulded shapes - Part 2: methods of test
Edition 2006-12-01

Detail Specification : rectangular connectors - Flat contacts, 0,8 mm thickness, locking screw not detachable
Edition 2006-12-01

Insulating materials - Industrial rigid round laminated tubes and rods based on thermosetting resins for electrical purposes - Part 3: specifications for individual materials - Sheet 3 : round laminated moulded rods
Edition 2006-12-01

Liquid crystal display devices - Part 3-1 : liquid crystal display (LCD) cells - Blank detail specification
Edition 2006-12-01

Semiconductor devices - Mechanical and climatic test methods - Part 35: acoustic microscopy for plastic encapsulated electronic components
Edition 2006-12-01

Aerospace series - Electrical contacts used in elements of connection - Part 054: contacts, electrical, male, thermocouple NiAl, type C, crimp, class T - Product standard
Edition 2006-12-01

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