Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices. Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence
Edition 2022-09-07

Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
Edition 2023-08-31

Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors. Test method for bias temperature instability
Edition 2022-10-05

Cutting tool data representation and exchange. Creation and exchange of 3D models. Turning tools with carbide tips
Edition 2017-02-28

CODE OF CARBIDE AND CERAMIC TIPS DESIGNATION FOR MECHANICAL FIXING TIPS.
Edition 1975-02-15

REFRACTORY MATERIALS. GENERAL CHARACTERISTICS OF THE REFRACTORIES OF SILICA CARBIDE
Edition 1975-03-15

DENTAL ROTARY INSTRUMENTS. BURS. PART 1: STEEL AND CARBIDE BURS (ISO 3823-1:1997)
Edition 1999-09-27

Hardmetals - Metallographic determination of microstructure - Part 3: Measurement of microstructural features in Ti (C, N) and WC/cubic carbide based hardmetals (ISO 4499-3:2016)
Edition 2016-09-28

Dentistry - Laboratory cutters - Part 2: Carbide laboratory cutters (ISO 7787-2:2020)
Edition 2020-11-11

Dentistry - Laboratory cutters - Part 3: Carbide cutters for milling machines (ISO 7787-3:2017) (Endorsed by Asociación Española de Normalización in July of 2017.)
Edition 2017-07-01