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BS IEC 63068-4
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices. Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence
Edition
2022-09-07
BS IEC 63229
Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
Edition
2023-08-31
BS IEC 63275-1
Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors. Test method for bias temperature instability
Edition
2022-10-05
PD ISO/TS 13399-310
Cutting tool data representation and exchange. Creation and exchange of 3D models. Turning tools with carbide tips
Edition
2017-02-28
UNE 16113
CODE OF CARBIDE AND CERAMIC TIPS DESIGNATION FOR MECHANICAL FIXING TIPS.
Edition
1975-02-15
UNE 61031
REFRACTORY MATERIALS. GENERAL CHARACTERISTICS OF THE REFRACTORIES OF SILICA CARBIDE
Edition
1975-03-15
UNE-EN ISO 3823-1
DENTAL ROTARY INSTRUMENTS. BURS. PART 1: STEEL AND CARBIDE BURS (ISO 3823-1:1997)
Edition
1999-09-27
UNE-EN ISO 4499-3
Hardmetals - Metallographic determination of microstructure - Part 3: Measurement of microstructural features in Ti (C, N) and WC/cubic carbide based hardmetals (ISO 4499-3:2016)
Edition
2016-09-28
UNE-EN ISO 7787-2
Dentistry - Laboratory cutters - Part 2: Carbide laboratory cutters (ISO 7787-2:2020)
Edition
2020-11-11
UNE-EN ISO 7787-3
Dentistry - Laboratory cutters - Part 3: Carbide cutters for milling machines (ISO 7787-3:2017) (Endorsed by Asociación Española de Normalización in July of 2017.)
Edition
2017-07-01