Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (IEC 60749-44:2016); German version EN 60749-44:2016
Edition 2017-04

Surface active agents - Bio-based surfactants - Requirements and test methods; German version EN 17035:2021
Edition 2021-12

Animal feeding stuffs: Methods of sampling and analysis - Determination of the radionuclides Iodine-131, Caesium-134 and Caesium-137 in feed; German version EN 17462:2021
Edition 2021-06

Neutron dosimetry - Part 3: Methods for neutron measurement in radiation protection
Edition 2007-06

Additive manufacturing - Design - Requirements, guidelines and recommendations (ISO/ASTM 52910:2018); German version EN ISO/ASTM 52910:2019
Edition 2020-02

Additive manufacturing - Design - Requirements, guidelines and recommendations (ISO/ASTM DIS 52910:2022); German and English version prEN ISO/ASTM 52910:2022
Edition 2022-09

Semiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices (IEC 47E/812/CDV:2023); German and English version prEN IEC 60747-15:2023
Edition 2024-06

Space engineering - Part 34: Environmental control and life support (ECLS); English version EN 16603-34:2014
Edition 2014-11

Process management for avionics - Management plan - Part 1: Preparation and maintenance of an electronic components management plan (IEC 62239-1:2018); German version EN IEC 62239-1:2018
Edition 2019-06

European CBRNE glossary; German version EN 17173:2020
Edition 2020-12